Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

• Introduction. Materials and Structures of Optical Devices: Materials for Optical Devices. Structures of Optical Devices. Crystal Growth: Preparation of Materials by LPE. Preparation of Materials by MOVPE. Preparation of Materials by MBE. Fabrication Processes of Optical Devices: Fabrication Processes. Device Characteristics and Life Testing: Device Characteristics. Life Testing of Devices. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices: Classification of Evaluation Techniques. Visual Inspection. Chemical Etching. Optical Measurement. Electrical Measurement. Structural Evaluation of Semiconductors by Transmission Electron Microscopy. Analytical Techniques. Flow Chart for Evaluation of Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors I -- Defect Generation: Classification of Defects. Growth-induced Defects. Process-induced defects. Materials Issues in III-V Compound Semiconductors I -- Thermal Stability of III-V Alloy Semiconductors: Composition Modulated Structures. Ordered Structures. Influence of Modulated Structures on the Properties and Reliability of Optical Devices. Classification of Degradation Modes and Degradation Phenomena in Optical Devices: Classification of Degradation Modes in the Life Testing of Lasers and LEDs. Classification of Degradation Phenomena in Lasers. Degradation in LEDs. Influence of Stress on the Device Degradation. Degradation I -- Rapid Degradation: Rapid Degradation in GaAlAs/GaAs Optical Devices. Rapid Degradation in InGaAsP/InP Optical Devices. Rapid Degradation in InGaAsP/InGaP Optical Devices. Comparison of Recombination-enhanced Defect Reaction in Different III-V Materials. Elimination of the Rapid Degradation. Degradation II -- Gradual Degradation: Gradual Degradation in GaAlAs DH LEDs. Gradual Degradation in InGaAsP/InP DH LEDs. Comparison of Gradual Degradation in GaAlAs/GaAs and In GaAsP/InP Optical Devices. Enhancement of Gradual Degradation by Internal Stress in GaAlAs Visible Lasers. Degradation III -- Catastrophic Failure: Catastrophic Failure in Lasers. Catastrophic Failure in LEDs. Elimination of Catastrophic Failure.

Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

• Introduction. Materials and Structures of Optical Devices: Materials for Optical Devices. Structures of Optical Devices. Crystal Growth: Preparation of Materials by LPE. Preparation of Materials by MOVPE. Preparation of Materials by MBE. Fabrication Processes of Optical Devices: Fabrication Processes. Device Characteristics and Life Testing: Device Characteristics. Life Testing of Devices. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices: Classification of Evaluation Techniques. Visual Inspection. Chemical Etching. Optical Measurement. Electrical Measurement. Structural Evaluation of Semiconductors by Transmission Electron Microscopy. Analytical Techniques. Flow Chart for Evaluation of Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors I -- Defect Generation: Classification of Defects. Growth-induced Defects. Process-induced defects. Materials Issues in III-V Compound Semiconductors I -- Thermal Stability of III-V Alloy Semiconductors: Composition Modulated Structures. Ordered Structures. Influence of Modulated Structures on the Properties and Reliability of Optical Devices. Classification of Degradation Modes and Degradation Phenomena in Optical Devices: Classification of Degradation Modes in the Life Testing of Lasers and LEDs. Classification of Degradation Phenomena in Lasers. Degradation in LEDs. Influence of Stress on the Device Degradation. Degradation I -- Rapid Degradation: Rapid Degradation in GaAlAs/GaAs Optical Devices. Rapid Degradation in InGaAsP/InP Optical Devices. Rapid Degradation in InGaAsP/InGaP Optical Devices. Comparison of Recombination-enhanced Defect Reaction in Different III-V Materials. Elimination of the Rapid Degradation. Degradation II -- Gradual Degradation: Gradual Degradation in GaAlAs DH LEDs. Gradual Degradation in InGaAsP/InP DH LEDs. Comparison of Gradual Degradation in GaAlAs/GaAs and In GaAsP/InP Optical Devices. Enhancement of Gradual Degradation by Internal Stress in GaAlAs Visible Lasers. Degradation III -- Catastrophic Failure: Catastrophic Failure in Lasers. Catastrophic Failure in LEDs. Elimination of Catastrophic Failure.

Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

• Introduction. Materials and Structures of Optical Devices: Materials for Optical Devices. Structures of Optical Devices. Crystal Growth: Preparation of Materials by LPE. Preparation of Materials by MOVPE. Preparation of Materials by MBE. Fabrication Processes of Optical Devices: Fabrication Processes. Device Characteristics and Life Testing: Device Characteristics. Life Testing of Devices. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices: Classification of Evaluation Techniques. Visual Inspection. Chemical Etching. Optical Measurement. Electrical Measurement. Structural Evaluation of Semiconductors by Transmission Electron Microscopy. Analytical Techniques. Flow Chart for Evaluation of Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors I -- Defect Generation: Classification of Defects. Growth-induced Defects. Process-induced defects. Materials Issues in III-V Compound Semiconductors I -- Thermal Stability of III-V Alloy Semiconductors: Composition Modulated Structures. Ordered Structures. Influence of Modulated Structures on the Properties and Reliability of Optical Devices. Classification of Degradation Modes and Degradation Phenomena in Optical Devices: Classification of Degradation Modes in the Life Testing of Lasers and LEDs. Classification of Degradation Phenomena in Lasers. Degradation in LEDs. Influence of Stress on the Device Degradation. Degradation I -- Rapid Degradation: Rapid Degradation in GaAlAs/GaAs Optical Devices. Rapid Degradation in InGaAsP/InP Optical Devices. Rapid Degradation in InGaAsP/InGaP Optical Devices. Comparison of Recombination-enhanced Defect Reaction in Different III-V Materials. Elimination of the Rapid Degradation. Degradation II -- Gradual Degradation: Gradual Degradation in GaAlAs DH LEDs. Gradual Degradation in InGaAsP/InP DH LEDs. Comparison of Gradual Degradation in GaAlAs/GaAs and In GaAsP/InP Optical Devices. Enhancement of Gradual Degradation by Internal Stress in GaAlAs Visible Lasers. Degradation III -- Catastrophic Failure: Catastrophic Failure in Lasers. Catastrophic Failure in LEDs. Elimination of Catastrophic Failure.