Inbunden, Engelska, 1996
Reliability and Degradation of III-V Optical Devices
Av Osamu Ueda
1954 kr
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Beskrivning
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
Produktinformation
- Utgivningsdatum: 1996-09-30
- Mått: 156 x 234 x 22 mm
- Vikt: 698 g
- Format: Inbunden
- Språk: Engelska
- Serie: Solid State Technology & Devices Library
- Antal sidor: 372
- Förlag: Artech House Publishers
- ISBN: 9780890066522
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Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.
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