ROGER K. YOUREE is a Systems Scientist at Instrumental Sciences, Inc. Dr. Youree received his Doctorate degree in Applied Mathematics from the University of Alabama in Huntsville, USA, and has more than thirty-five years of experience with military, NASA, and commercial programs, including responsibilities such as planning, cost estimates, and progress tracking. Dr. Youree has extensive expertise in reliability engineering, including RAM Plan development, requirements development, modeling for allocation, predictions, and system improvement.

• Preface xiSeries Editor’s Foreword by Dr. Andre Kleyner xiiiAcronyms xvGlossary xvii1 Introduction 11.1 Description of the Problem 11.2 Implications for Software Reliability 2References 32 Understanding Defects 52.1 Where Defects Enter the Project System 52.2 Effects of Defects 62.3 Detection of Defects 72.4 Causes of Defects 9References 123 Handling Defects 133.1 Strategy for Handling Defects 133.2 Objectives 143.3 Plan 153.4 Implementation, Monitoring, and Feedback 283.5 Analogies Between Hardware and Software Reliability Engineering 31References 334 Project Phases 354.1 Introduction to Project Phases 354.2 Concept Development and Planning 434.2.1 Description of the CDP Phase 434.2.2 Defects Typical for the CDP Phase 464.2.3 Techniques and Processes for the CDP Phase 474.2.4 Metrics for the CDP Phase 514.3 Requirements and Interfaces 624.3.1 Description of the Requirements and Interfaces Phase 624.3.2 Defects Typical for the Requirements and Interfaces Phase 634.3.3 Techniques and Processes for the Requirements and Interfaces Phase 654.3.4 Metrics for the Requirements and Interfaces Phase 684.4 Design and Coding 734.4.1 Description of the DC Phase 734.4.2 Defects Typical for the DC Phase 764.4.3 Techniques and Processes for the DC Phase 784.4.4 Metrics for the DC Phase 824.5 Integration, Verification, and Validation 914.5.1 Description of the IV&V Phase 914.5.2 Defects Typical for the IV&V Phase 944.5.3 Techniques and Processes for the IV&V Phase 964.5.4 Metrics for the IV&V Phase 984.6 Product Production and Release 1054.6.1 Description of the Product Production and Release Phase 1064.6.2 Defects Typical for the Product Production and Release Phase 1074.6.3 Techniques and Processes for the Product Production and Release Phase 1084.6.4 Metrics for the Product Production and Release Phase 1114.7 Operation and Maintenance 1154.7.1 Description of the Operation and Maintenance Phase 1164.7.2 Defects Typical for the OM Phase 1194.7.3 Techniques and Processes for the OM Phase 1194.7.4 Metrics for the OM Phase 1214.8 Management 1254.8.1 Description of Management 1254.8.2 Defects Typical for Management 1264.8.3 Techniques and Processes for Management 1284.8.4 Metrics for Management 131References 1395 Roadmap and Practical Guidelines 1415.1 Summary and Roadmap 1415.1.1 Start of a Project 1425.1.2 As a Member of an Organization 1455.1.3 Troubled Projects 1455.2 Guidelines 149References 1506 Techniques 1516.1 Introduction to the Techniques 1516.2 Techniques for Systems Engineering 1516.3 Techniques for Software 1616.4 Techniques for Reliability Engineering 1796.5 Project-Wide Techniques and Techniques for Quality Assurance 254References 316Index 323

ROGER K. YOUREE is a Systems Scientist at Instrumental Sciences, Inc. Dr. Youree received his Doctorate degree in Applied Mathematics from the University of Alabama in Huntsville, USA, and has more than thirty-five years of experience with military, NASA, and commercial programs, including responsibilities such as planning, cost estimates, and progress tracking. Dr. Youree has extensive expertise in reliability engineering, including RAM Plan development, requirements development, modeling for allocation, predictions, and system improvement.

• Preface xiSeries Editor’s Foreword by Dr. Andre Kleyner xiiiAcronyms xvGlossary xvii1 Introduction 11.1 Description of the Problem 11.2 Implications for Software Reliability 2References 32 Understanding Defects 52.1 Where Defects Enter the Project System 52.2 Effects of Defects 62.3 Detection of Defects 72.4 Causes of Defects 9References 123 Handling Defects 133.1 Strategy for Handling Defects 133.2 Objectives 143.3 Plan 153.4 Implementation, Monitoring, and Feedback 283.5 Analogies Between Hardware and Software Reliability Engineering 31References 334 Project Phases 354.1 Introduction to Project Phases 354.2 Concept Development and Planning 434.2.1 Description of the CDP Phase 434.2.2 Defects Typical for the CDP Phase 464.2.3 Techniques and Processes for the CDP Phase 474.2.4 Metrics for the CDP Phase 514.3 Requirements and Interfaces 624.3.1 Description of the Requirements and Interfaces Phase 624.3.2 Defects Typical for the Requirements and Interfaces Phase 634.3.3 Techniques and Processes for the Requirements and Interfaces Phase 654.3.4 Metrics for the Requirements and Interfaces Phase 684.4 Design and Coding 734.4.1 Description of the DC Phase 734.4.2 Defects Typical for the DC Phase 764.4.3 Techniques and Processes for the DC Phase 784.4.4 Metrics for the DC Phase 824.5 Integration, Verification, and Validation 914.5.1 Description of the IV&V Phase 914.5.2 Defects Typical for the IV&V Phase 944.5.3 Techniques and Processes for the IV&V Phase 964.5.4 Metrics for the IV&V Phase 984.6 Product Production and Release 1054.6.1 Description of the Product Production and Release Phase 1064.6.2 Defects Typical for the Product Production and Release Phase 1074.6.3 Techniques and Processes for the Product Production and Release Phase 1084.6.4 Metrics for the Product Production and Release Phase 1114.7 Operation and Maintenance 1154.7.1 Description of the Operation and Maintenance Phase 1164.7.2 Defects Typical for the OM Phase 1194.7.3 Techniques and Processes for the OM Phase 1194.7.4 Metrics for the OM Phase 1214.8 Management 1254.8.1 Description of Management 1254.8.2 Defects Typical for Management 1264.8.3 Techniques and Processes for Management 1284.8.4 Metrics for Management 131References 1395 Roadmap and Practical Guidelines 1415.1 Summary and Roadmap 1415.1.1 Start of a Project 1425.1.2 As a Member of an Organization 1455.1.3 Troubled Projects 1455.2 Guidelines 149References 1506 Techniques 1516.1 Introduction to the Techniques 1516.2 Techniques for Systems Engineering 1516.3 Techniques for Software 1616.4 Techniques for Reliability Engineering 1796.5 Project-Wide Techniques and Techniques for Quality Assurance 254References 316Index 323

ROGER K. YOUREE is a Systems Scientist at Instrumental Sciences, Inc. Dr. Youree received his Doctorate degree in Applied Mathematics from the University of Alabama in Huntsville, USA, and has more than thirty-five years of experience with military, NASA, and commercial programs, including responsibilities such as planning, cost estimates, and progress tracking. Dr. Youree has extensive expertise in reliability engineering, including RAM Plan development, requirements development, modeling for allocation, predictions, and system improvement.

• Preface xiSeries Editor’s Foreword by Dr. Andre Kleyner xiiiAcronyms xvGlossary xvii1 Introduction 11.1 Description of the Problem 11.2 Implications for Software Reliability 2References 32 Understanding Defects 52.1 Where Defects Enter the Project System 52.2 Effects of Defects 62.3 Detection of Defects 72.4 Causes of Defects 9References 123 Handling Defects 133.1 Strategy for Handling Defects 133.2 Objectives 143.3 Plan 153.4 Implementation, Monitoring, and Feedback 283.5 Analogies Between Hardware and Software Reliability Engineering 31References 334 Project Phases 354.1 Introduction to Project Phases 354.2 Concept Development and Planning 434.2.1 Description of the CDP Phase 434.2.2 Defects Typical for the CDP Phase 464.2.3 Techniques and Processes for the CDP Phase 474.2.4 Metrics for the CDP Phase 514.3 Requirements and Interfaces 624.3.1 Description of the Requirements and Interfaces Phase 624.3.2 Defects Typical for the Requirements and Interfaces Phase 634.3.3 Techniques and Processes for the Requirements and Interfaces Phase 654.3.4 Metrics for the Requirements and Interfaces Phase 684.4 Design and Coding 734.4.1 Description of the DC Phase 734.4.2 Defects Typical for the DC Phase 764.4.3 Techniques and Processes for the DC Phase 784.4.4 Metrics for the DC Phase 824.5 Integration, Verification, and Validation 914.5.1 Description of the IV&V Phase 914.5.2 Defects Typical for the IV&V Phase 944.5.3 Techniques and Processes for the IV&V Phase 964.5.4 Metrics for the IV&V Phase 984.6 Product Production and Release 1054.6.1 Description of the Product Production and Release Phase 1064.6.2 Defects Typical for the Product Production and Release Phase 1074.6.3 Techniques and Processes for the Product Production and Release Phase 1084.6.4 Metrics for the Product Production and Release Phase 1114.7 Operation and Maintenance 1154.7.1 Description of the Operation and Maintenance Phase 1164.7.2 Defects Typical for the OM Phase 1194.7.3 Techniques and Processes for the OM Phase 1194.7.4 Metrics for the OM Phase 1214.8 Management 1254.8.1 Description of Management 1254.8.2 Defects Typical for Management 1264.8.3 Techniques and Processes for Management 1284.8.4 Metrics for Management 131References 1395 Roadmap and Practical Guidelines 1415.1 Summary and Roadmap 1415.1.1 Start of a Project 1425.1.2 As a Member of an Organization 1455.1.3 Troubled Projects 1455.2 Guidelines 149References 1506 Techniques 1516.1 Introduction to the Techniques 1516.2 Techniques for Systems Engineering 1516.3 Techniques for Software 1616.4 Techniques for Reliability Engineering 1796.5 Project-Wide Techniques and Techniques for Quality Assurance 254References 316Index 323