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John B. Newkirk, Gavin R. Mallett - Advances in X-Ray Analysis, Häftad

Häftad, Engelska, 2012

Advances in X-Ray Analysis

Volume 10

Av John B. Newkirk, Gavin R. Mallett

552 kr

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Beskrivning
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses­ sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
Produktinformation
  • Utgivningsdatum: 2012-06-12
  • Mått: 178 x 254 x 31 mm
  • Vikt: 1 061 g
  • Format: Häftad
  • Språk: Engelska
  • Antal sidor: 558
  • Förlag: Springer-Verlag New York Inc.
  • ISBN: 9781468478372
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