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      1. Naturvetenskap och teknik
      2. Teknik och industri
      3. Elektronik och kommunikationer

      Test and Measurement: Know It All

      AvJon S. Wilson,Stuart Ball

      Häftad, Engelska, 2008

      Del i serien Newnes Know It All

      666 kr

      Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt över 249 kr.

      Beskrivning

      The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing.

      • A 360-degree view from our best-selling authors
      • Topics include the Technology of Test and Measurement, Measurement System Types, and Instrumentation for Test and Measurement
      • The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume

      Produktinformation

      • Utgivningsdatum:2008-11-04
      • Mått:190 x 235 x 29 mm
      • Vikt:1 550 g
      • Format:Häftad
      • Språk:Engelska
      • Serie:Newnes Know It All
      • Antal sidor:912
      • Förlag:Elsevier Science
      • ISBN:9781856175302

      Utforska kategorier

      • Elektronik och kommunikationer inom Naturvetenskap och teknik

      Mer om författaren

      Senior Electrical Engineer who has worked for the past twenty years in the field of embedded control systems. He previously worked on Global Positioning Systems and secure communications equipment at Rockwell International, on document processing equipment at Banctec, and on medical electronics at Organon-Teknika. He has written several books and many articles for periodicals such as Circuit Cellar INK, and Modern Electronics. Ed Ramsden is an electrical engineer who has been working with Hall effect sensors since 1988. His experience ranges from designing Hall effect integrated circuits to developing novel magnetic processing techniques. He has written over a dozen technical articles on sensor-related topics, and he holds four U.S patents in the area of magnetic sensor technology. Dogan Ibrahim graduated from the University of Salford with First Class Honours in Electronic Engineering. He then completed an MSc course in Automatic Control Engineering at the University of Manchester, and PhD in Digital Signal Processing at the City University in London. Prof Ibrahim worked at several companies and gained industrial experience before returning to the academic life. Prof Ibrahim is currently a Fellow of the IET, and a Chartered Electrical Engineer. His interests are in the fields of microcontroller based automatic control, digital signal processing, and computer aided design. Dogan Ibrahim has been a lecturer at South Bank University, London, and Principal Research Engineer at GEC Hirst Research Centre. Prof Ibrahim is the author of over 70 technical books in the fields of microcontrollers and electronic engineering. He is currently a systems consultant, carrying out consultancy work to various firms in London.

      Innehållsförteckning

      • Chapter 1 Fundamental of measurementChapter 2 Sensors and TransducersChapter 3. Data acquisition hardware and softwareChapter 4. Overview of measurement systemsChapter 5 Acceleration, Shock and VibrationChapter 6 FlowChapter 7 TemperatureChapter 8 PressureChapter 9. PositionChapter 10 Strain gauges, loadcells and weighingChapter 11 LightChapter 12 Signal Processing and ConditioningChapter 13 Interfacing and Data CommunicationsChapter 14 Data acquisition softwareChapter 15. Scaling and calibrationChapter 16. Synthetic instrumentsChapter 17 Real-world measurement applicationsChapter 18. Testing methodsChapter 19 Boundary Scan TechniquesChapter 20 Inspection TestChapter 21 EMC fundamentalsChapter 22 Measuring RF emissionsChapter 23 Test methodsChapter 24 Test planningCHAPTER 25 Accelerated testing fundamentalsChapter 26 HALT and FMVTAppendix A: Standard Interfaces
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