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Ambika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu - VLSI Design and Test, Häftad

Häftad, Engelska, 2022

VLSI Design and Test

26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

Av Ambika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu

Del 1687 i serien Communications in Computer and Information Science

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This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
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