Beställningsvara. Skickas inom 5-8 vardagar. Fri frakt över 249 kr.
Beskrivning
No detailed description available for "16 January".
Produktinformation
Utgivningsdatum:1990-01-14
Mått:175 x 246 x 35 mm
Vikt:1 073 g
Format:Inbunden
Språk:Engelska
Antal sidor:538
Upplaga:90001
Förlag:De Gruyter
ISBN:9783112472859
Innehållsförteckning
Frontmatter -- Contents -- Systematic List -- International Classification System for Physics -- Substance Classification -- Review Article -- Electrodeposition of Thin Film Semiconductors -- Original Papers and Short Notes -- Structure -- Method of Determining Supersmall Dilatations in a Crystal Lattice -- An Electron Microscope Method for Determining the Nature of Stacking Faults in F.C.C. Materials which Does not Rely on Effects of Absorption -- Investigation of 57Fe-Doped ?-AlxV2O5 Bronzes -- Investigation of Low-Temperature Epitaxial Regrowth of Ion-Implanted Amorphous GaAs -- Calculation of TEM Contrast of Small Coherent Precipitates -- Defects; nonelectronic transport -- Plasma Stimulated Impurity Redistribution in Silicon -- Diffusion of Hydrogen in Nickel Based Alloys -- Development of Eshelby Concept in the Solution of Boundary Problems for Elastic Solids with Defects -- Grain Boundary Microdamage Due to Visco-Elastic Relaxation of Residual Stresses in Alumina Ceramics -- Lattice properties -- Fracture in Titanium Dihoride -- Activation Parameters of Linear Heating Crystallisation in Ni70.3Fe4.7Si15B10 Glassy Alloy Determined Using the Internal Friction Method -- Plastic Instability during Combined Torsion-Tension Deformation in Al-0.72% Si Alloy -- Influence of the Microstructure on Some Microwave Properties of Substituted Nickel Ferrites -- Stress-Induced Effects in the Incommensurate Phase of Quartz -- Relation between Plastic Deformation and the Blaha Effect for Alkali Halide Crystals -- Surfaces, interfaces, thin films; lower-dimensional systems -- Argon Irradiation of Sn Thin Layers Deposited on Fe Substrates -- Etude de la résistivité de couches minces polycristallines de MoSe2 -- Photocurrent Generation and Optical Transitions on Degenerate Cadmium Oxide Photoanodes -- Relaxation of Trapping Sites in the ZnSe Films of Au-ZnSe-Si02-Si and Au-ZnSe-Gre Structures -- Extended electronic states -- Etude par diffraction de R-X de la densité de charge de valence dans les deux semi-conducteurs tétraédriques ZnSiAs2 et ZnGeAs2 -- Electronic transport; superconductivity -- 3Iicroscopic Origin of Electric Conduction Anisotropy in Plastically Deformed CdS Single Crystals -- Semiconducting and Thermoelectric Properties of Sintered Iron Disilicide -- Magnetic properties; resonances -- The Kinetics of the Magnetically Induced Anisotropy in Amorphous Ferromagnetic Co71Fe1Mo1Mn4Si14B9 and Fe41Ni41B18 Alloy -- The EPR Study of Inhomogeneous Deformations in Neutron-Irradiated Silicon -- Effect of Rolling and Heat Treatment on the Irreversible Magnetization in Nickel-Chromium Wire -- EPR Studies of LiNaSO4 Cr6+ Doped Monocrystals after X-Ray Irradiation -- Magnetoelastic Properties of Some Fe-Rich Fe-Co-Si-B Metallic Glasses -- Magnetic Behaviour of TmCu2 below Tx -- Dielectric and optical properties -- Fundamental Optical Absorption Edge in MnIn2Te4 Single Crystals -- Change of the Optical Properties of CdS Single Crystals upon High Dose Indium and Gallium Implantation -- Polarization Reversal Current Behaviour for Parallel and Antiparallel Rubbed Surface Stabilized Ferroelectric Liquid Crystals -- Cathodo- and Photolumincscence in the Mn2+ Activated Garnets Cd3-xCaxAl2Ge3O12 -- The Determination of Distributions of the Parameters of Thermally Stimulated Depolarization Current Peaks: Theory -- On the Nature of Afterglow of the X-Ray Induced Luminescence in Crystalline and Glassy SiO2 -- Lateral Distribution of Si-Related Defects and Carrier Density in GaAs Crystals -- X-Ray Spectroscopic Investigations of Titanium Oxides and Basic Materials for Ferroelectric Ceramics -- Device-related phenomena -- The Noise of the GaAlAs Super-LED Radiation -- Approximate Calculation of the Switching Voltage of MISS -- Influence of Surface Recombination on the Rate of Electron Leakage in Ridge-Waveguide Injection Lasers -- Metal Influence on Switching MIM Diodes -- Short Notes -- Structure -- Note on the Crystal Structure of FeCoGe and FeN
