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Eishi Ibe – författare

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1 produkter

  1. Takashi Nakamura, Mamoru Baba, Eishi Ibe, Yasuo Yahagi, Hideaki Kameyama - TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES, Inbunden. Tillgänglighet: Tillfälligt slut

    TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES

    Av Takashi Nakamura, Mamoru Baba m. fl.

    Inbunden, 2008

    2312 kr

    Tillfälligt slut

    Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the …