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Rohit Kapur – författare

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3 produkter

  1. Rohit Kapur - CTL for Test Information of Digital ICs, E-bok. Tillgänglighet: Lägg i varukorg

    CTL for Test Information of Digital ICs

    Av Rohit Kapur

    E-bok, 2007

    1459 kr

    Lägg i varukorg

    CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test …

  2. Rohit Kapur - CTL for Test Information of Digital ICs, Inbunden. Tillgänglighet: Lägg i varukorg

    CTL for Test Information of Digital ICs

    Av Rohit Kapur

    Inbunden, 2002

    1093 kr

    Lägg i varukorg

    CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6, namely the Core Test Language (CTL), has its beginnings in the IEEE 1500 standardization activity as the language to represent test …

  3. Rohit Kapur - CTL for Test Information of Digital ICs, Häftad. Tillgänglighet: Lägg i varukorg

    CTL for Test Information of Digital ICs

    Av Rohit Kapur

    Häftad, 2013

    1093 kr

    Lägg i varukorg

    CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test …