Bokus

Stewart E. Rauch III – författare

Visar alla böcker från författaren Stewart E. Rauch III. Handla med fri frakt och snabb leverans.

1 produkter

  1. Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III - Reliability Wearout Mechanisms in Advanced CMOS Technologies, Inbunden. Tillgänglighet: Lägg i varukorg

    Reliability Wearout Mechanisms in Advanced CMOS Technologies

    Av Alvin W. Strong, Ernest Y. Wu m. fl.

    Inbunden, 2009

    2266 kr

    Lägg i varukorg

    This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or …