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1 produkter

1. 

   Characterization in Silicon Processing

   Av Yale Strausser

   E-bok, 2013

   807 kr

   Lägg i varukorg

   This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to …