Yasuo Yahagi – författare
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TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES
Av Takashi Nakamura, Mamoru Baba m. fl.
Inbunden, 2008
2312 kr
Tillfälligt slut
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the …