RFID Technology and Applications

Stephen B. Miles is a research engineer for the Auto-ID Lab. at MIT. He has over 15 years of experience in computer network integration and services. Sanjay E. Sarma is currently an associate professor at MIT, where he is also a co-founder of the Auto-ID Center. He serves on the board of EPC global, the world wide standards body he helped to start up. John R. Williams is Director of the Auto-ID Lab at MIT, and is also a professor of Information Engineering in Civil and Environmental Engineering. As well as many years of lecturing, he has also worked in industry and was the Vice President of Engineering at two software start-up companies.

Review of the hardback: 'RFID Technology and Applications is a high-level tour of RFID usage with enough depth to make it a very useful reference.' IEEE Microwave Magazine

• Preface; List of contributors; 1. Introduction to RFID history and markets Stephen Miles; 2. RFID technology and its applications Sanjay Sarma; 3. RFID tag performance optimization - a chip perspective Hao Min; 4. Resolution and integration of HF and UHF Marlin H. Mickle, Leonid Mats, and Peter J. Hawrylak; 5. Integrating sensors and actuators into RFID tags J.T. Cain and Kang Lee; 6. Performance evaluation of WiFi RFID localization technologies Mohammad Heidari and Kaveh Pahlavan; 7. Modeling supply chain network traffic John R. Williams, Abel Sanchez, Paul Hofmann, Tao Lin, Michael Lipton, and Krish Mantripragada; 8. Deployment considerations for active RFID systems Gisele Bennett and Ralph Herkert; 9. RFID in the retail supply chain - issues and opportunities Bill C. Hardgrave and Robert Miller; 10. Reducing barriers to ID system adoption in the aerospace industry - the aerospace ID technologies programme; Duncan McFarlane, Alan Thorne, Mark Harrison and Victor Prodonoff Jr.; 11. The cold chain J. P. Emond; 12. The application of RFID as anticounterfeiting technique - issues & opportunities Thorsten Staake, Florian Michahelles, and Elgar Fleisch; 13. Closing product information loops with product embedded information devices: RFID technology and applications, models and metrics Dimitris Kiritsis, Hong-Bae Jun, and Paul Xirouchakis; 14. Moving from RFID to autonomous cooperating logistic processes Bernd Scholz-Reiter, Dieter Uckelmann, Christian Gorldt, Uwe Hinrichs, and Jan Topi Tervo; 15. Conclusions Stephen Miles, Sanjay Sarma and John Williams; Appendix: Links to RFID technology and applications resources I. RFID interface specifications; II. Test capabilities (in the order of chapters as presented); III. Simulation environments.