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M. Aindow, C. J. Kiely - Electron Microscopy and Analysis 2001, Inbunden

Inbunden, Engelska, 2001

Electron Microscopy and Analysis 2001

Av M. Aindow, C. J. Kiely

4666 kr

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Beskrivning
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
Produktinformation
  • Utgivningsdatum: 2001-12-01
  • Mått: 156 x 234 x 36 mm
  • Vikt: 1 060 g
  • Format: Inbunden
  • Språk: Engelska
  • Serie: Institute of Physics Conference Series
  • Antal sidor: 529
  • Förlag: Taylor & Francis Ltd
  • ISBN: 9780750308120
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