Handbook of X-Ray Spectrometry

Inbunden, Engelska, 2001

5 713 kr

Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt över 249 kr.

Beskrivning

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

Produktinformation

Utgivningsdatum:2001-11-27
Mått:210 x 280 x 58 mm
Vikt:1 814 g
Format:Inbunden
Språk:Engelska
Serie:Practical Spectroscopy
Antal sidor:1 004
Upplaga:2
Förlag:Taylor & Francis Inc
ISBN:9780824706005

Utforska kategorier

Analytisk kemi inom Naturvetenskap och teknik

Mer om författaren

Rene van GriekenAndrzej Markowicz

Recensioner i media

"Industry accolades for the previous edition. . . . . .should be available to all workers in x-ray analysis, and they should do more than just scan the various chapters, but read them in detail....anyone who does that will learn something, regardless of how long they have been working in the field."---X-Ray Spectrometry

Innehållsförteckning

X-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.