Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors

Farzan Jazaeri is a Scientist at the Ecole Polytechnique Fédérale de Lausanne where his research interests focus on semiconductor devices and physics, and particularly the modeling and fabrication of field-effect transistors. Jean-Michel Sallese is a Senior Scientist at the Ecole Polytechnique Fédérale de Lausanne. He specialises in the analytical modeling of bulk and multigate field-effect transistors.

• 1. Introduction; 2. Review on modeling junctionless FETs; 3. The EPFL charge-based model of junctionless field-effect transistors; 4. Model driven design – space of junctionless FETs; 5. Generalization of the charge based model: accounting for inversion layers; 6. Predicted performances of junctionless FETs; 7. Short channel effects in symmetric junctionless double-gate FETs; 8. Modeling AC operation in symmetric double-gate and nanowire JL FETs; 9. Modeling asymmetric operation of double-gate junctionless FETs; 10. Modeling noise behavior in junctionless FETs; 11. Carrier mobility extraction methodology in JL and inversion mode FETs; 12. Revisiting the Junction FET: a junctionless FET with an ∞ gate capacitance; 13. Modeling junctionless FET with interface traps targeting biosensor applications; Appendix A. Design – space of twin gate junctionless vertical slit FETs; Appendix B. Transient off-current in junctionless FETs; Appendix C. Derivatives of mobile charge density with respect to VGS and VDS; Appendix D. Global charge density at drain in depletion mode; Appendix E. Global charge density at drain in accumulation mode; Appendix F. The EPFL Junctionless MODEL ver.1.0.