Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.

• 1. Photoluminescence Imaging2. MicroRaman Spectroscopy of Semiconductors: Principles and Applications3. Near-Field Scanning Optical Microscopy of Semiconductor Nanostructures4. Cross-sectional Scanning Tunneling Microscopy Studies of Heterostructures5. Application of Transmission Electron Microscopy to Study Interfaces in Optoelectronic Materials6. Electron Beam Induced Luminescence Studies of Low-dimensional Semiconductor Structures7. X-ray Topography8. Selective Etching and Complementary Microprobe Techniques (SFM, EBIC)

Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.

• 1. Photoluminescence Imaging2. MicroRaman Spectroscopy of Semiconductors: Principles and Applications3. Near-Field Scanning Optical Microscopy of Semiconductor Nanostructures4. Cross-sectional Scanning Tunneling Microscopy Studies of Heterostructures5. Application of Transmission Electron Microscopy to Study Interfaces in Optoelectronic Materials6. Electron Beam Induced Luminescence Studies of Low-dimensional Semiconductor Structures7. X-ray Topography8. Selective Etching and Complementary Microprobe Techniques (SFM, EBIC)

Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.

• 1. Photoluminescence Imaging2. MicroRaman Spectroscopy of Semiconductors: Principles and Applications3. Near-Field Scanning Optical Microscopy of Semiconductor Nanostructures4. Cross-sectional Scanning Tunneling Microscopy Studies of Heterostructures5. Application of Transmission Electron Microscopy to Study Interfaces in Optoelectronic Materials6. Electron Beam Induced Luminescence Studies of Low-dimensional Semiconductor Structures7. X-ray Topography8. Selective Etching and Complementary Microprobe Techniques (SFM, EBIC)