Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid–structure interaction studies, reliability and optimization.

• 1. Reliability-Based Design Optimization2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques5. Characterization of Switching Transistors under Electrical Overvoltage Stresses6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress7. Internal Temperature Measurement of Electronic Components8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide9. Study of the Dynamic Contact Between Deformable Solids

Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid–structure interaction studies, reliability and optimization.

• 1. Reliability-Based Design Optimization2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques5. Characterization of Switching Transistors under Electrical Overvoltage Stresses6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress7. Internal Temperature Measurement of Electronic Components8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide9. Study of the Dynamic Contact Between Deformable Solids