Adam Foster - Böcker

The book discusses the analysis and manipulation of processes on the atomic scale by forces and currents and gives a broad overview from a common perspective on the different fields of Scanning Probe Microscopy (SPM). Such a combined treatment is suggested theoretically, because both are just different aspects of physical and chemical processes at atomic interfaces. Forces do play an important role in Scanning Tunneling Microscopy (STM), and currents are an important issue in Atomic Force Microscopy (AFM). Experimentally, the existence of instruments for combined force/current measurements make the same point. This unique overview fills the gap in the litterature. USP: -Unique treatment of both Atomic Force Microscopy and Scanning Tunneling Microscopy -Written by leading experts -Gives a broad overview both from theory and experiments

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. Key FeaturesServes as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopyProvides a framework for linking scanning probe theory and simulations with experimental dataWritten in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations