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Cutting-Edge CMOS VLSI Design for Manufacturability Techniques
This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource.
Nanoscale CMOS VLSI Circuits covers:
Current trends in CMOS VLSI designSemiconductor manufacturing technologiesPhotolithographyProcess and device variability: analyses and modelingManufacturing-Aware Physical Design ClosureMetrology, manufacturing defects, and defect extractionDefect impact modeling and yield improvement techniquesPhysical design and reliabilityDFM tools and methodologies