Chenggang Zuo – författare

Automotive-Grade Electronics: Reliability Design Theory, Development Process, and Full Lifetime Management provides readers with a comprehensive, up-to-date, expert, and best practice reference resource. The book fills a gap in the current literature by providing readers with a systematic exploration of reliability design theory, development processes, and full lifetime management of automotive-grade electronics, for both components and parts. The book takes a unique industry perspective, drawing upon the authors' two decades of experience in the electronics industry.Provides best practice guidance for R&D, testing, and manufacturing in the automotive electronic, chips, component, and parts industriesSystematically describes reliability design theory, development processes, and full lifetime management of automotive-grade electronics for both components and partsIncludes analysis of Architecture, Engineering, and Construction (AEC) standards for electronic components, automotive-grade certification, and functional safety (ISO 26262)Covers electrical and environment testing and Electromagnetic Compatibility (EMC) testing of automotive electronic parts, including Design Verification and Product Validation (DV/PV) testsExamines reliability requirements for the entire lifetime of a vehicle