Hans-Joachim Güntherodt – författare

This second edition of Scanning Tunneling Microscopy I, updated with a guide to recent literature, is a unique introduction into a novel and fascinating technique that produces beautiful images of nature on an atomic scale, offering a comprehensive treatment of scanning tunneling microscopy, its diverse applications and its theoretical treatment. The present volume describes in detail the technique itself, its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original works will help to make accessible the vast body of knowledge already accumulated in this field.

Presents accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes offer an account of experimental aspects of STM and provide useful reading and reference material. In this second edition the text has been updated and new methods are discussed.

Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the field of local probe methods.In this second edition the text has been updated and new methods are discussed.

Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment. In this volume the reader will find a detailed description of the technique itself and of its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original work will help to make accessible the vast body of knowledge already accumulated in this field.

Scanning Tunneling Microscopy II, like its predecessor,presents detailed and comprehensive accounts of the basicprinciples and broad range of applications of STM andrelated scanning probe techniques. The applicationsdiscussed in this volume come predominantly from the fieldsof electrochemistry and biology. In contrast to thosedescribed in Vol. I, these sudies may be performed in airand in liquids. The extensions of the basic technique tomap other interactions are described inchapters on scanningforce microscopy, magnetic force microscopy, scanningnear-field optical microscopy, together with a survey ofother related techniques. Also described here is the use ofa scanning proximal probe for surface modification.Togehter, the two volumes give a comprehensive account ofexperimental aspcets of STM. They provide essentialreadingand reference material for all students and researchersinvolvedin this field.