This monograph represents a summary of our work in the last two years in applying the method of simulated annealing to the solution of problems that arise in the physical design of VLSI circuits. Our study is experimental in nature, in that we are con­ cerned with issues such as solution representations, neighborhood structures, cost functions, approximation schemes, and so on, in order to obtain good design results in a reasonable amount of com­ putation time. We hope that our experiences with the techniques we employed, some of which indeed bear certain similarities for different problems, could be useful as hints and guides for other researchers in applying the method to the solution of other prob­ lems. Work reported in this monograph was partially supported by the National Science Foundation under grant MIP 87-03273, by the Semiconductor Research Corporation under contract 87-DP- 109, by a grant from the General Electric Company, and by a grant from the Sandia Laboratories.

This monograph represents a summary of our work in the last two years in applying the method of simulated annealing to the solution of problems that arise in the physical design of VLSI circuits. Our study is experimental in nature, in that we are con­ cerned with issues such as solution representations, neighborhood structures, cost functions, approximation schemes, and so on, in order to obtain good design results in a reasonable amount of com­ putation time. We hope that our experiences with the techniques we employed, some of which indeed bear certain similarities for different problems, could be useful as hints and guides for other researchers in applying the method to the solution of other prob­ lems. Work reported in this monograph was partially supported by the National Science Foundation under grant MIP 87-03273, by the Semiconductor Research Corporation under contract 87-DP- 109, by a grant from the General Electric Company, and by a grant from the Sandia Laboratories.

This monograph represents a summary of our work in the last two years in applying the method of simulated annealing to the solution of problems that arise in the physical design of VLSI circuits. Our study is experimental in nature, in that we are con­ cerned with issues such as solution representations, neighborhood structures, cost functions, approximation schemes, and so on, in order to obtain good design results in a reasonable amount of com­ putation time. We hope that our experiences with the techniques we employed, some of which indeed bear certain similarities for different problems, could be useful as hints and guides for other researchers in applying the method to the solution of other prob­ lems. Work reported in this monograph was partially supported by the National Science Foundation under grant MIP 87-03273, by the Semiconductor Research Corporation under contract 87-DP- 109, by a grant from the General Electric Company, and by a grant from the Sandia Laboratories.

This volume contains the proceedings of the USA-Japan Joint Seminar on "Fracture Mechanics of Ductile and Tough Materials and Its Applications to Energy Related Structures". The seminar was supported jointly by the National Science Foundation of the United States and the Japan Society for the Promotion of Sciences. The seminar was held from November 12th to 16th, 1979, at Hayama, Japan, a picturesque resort town by the beach of Sagami Bay facing Mt. Fugi. The safety and integrity of the engineering structures for energy explora­ tion, energy production, and energy transportation are of utmost importance to our welfare. Both the United States and Japan are at the forefront of the re­ search on fracture mechanics and its applications to fracture prevention. Dur­ ing the past few years, major research efforts have been made in the areas of non-linear fracture mechanics and its applications to fracture initiation, slow crack growth, creep and fatigue. This joint seminar offered an unique opportunity for detailed exchange of information on current researches and fu­ ture efforts.

This volume contains the proceedings of the USA-Japan Joint Seminar on "Fracture Mechanics of Ductile and Tough Materials and Its Applications to Energy Related Structures". The seminar was supported jointly by the National Science Foundation of the United States and the Japan Society for the Promotion of Sciences. The seminar was held from November 12th to 16th, 1979, at Hayama, Japan, a picturesque resort town by the beach of Sagami Bay facing Mt. Fugi. The safety and integrity of the engineering structures for energy explora­ tion, energy production, and energy transportation are of utmost importance to our welfare. Both the United States and Japan are at the forefront of the re­ search on fracture mechanics and its applications to fracture prevention. Dur­ ing the past few years, major research efforts have been made in the areas of non-linear fracture mechanics and its applications to fracture initiation, slow crack growth, creep and fatigue. This joint seminar offered an unique opportunity for detailed exchange of information on current researches and fu­ ture efforts.

This monograph represents a summary of our work in the last two years in applying the method of simulated annealing to the solution of problems that arise in the physical design of VLSI circuits. Our study is experimental in nature, in that we are con­ cerned with issues such as solution representations, neighborhood structures, cost functions, approximation schemes, and so on, in order to obtain good design results in a reasonable amount of com­ putation time. We hope that our experiences with the techniques we employed, some of which indeed bear certain similarities for different problems, could be useful as hints and guides for other researchers in applying the method to the solution of other prob­ lems. Work reported in this monograph was partially supported by the National Science Foundation under grant MIP 87-03273, by the Semiconductor Research Corporation under contract 87-DP- 109, by a grant from the General Electric Company, and by a grant from the Sandia Laboratories.

This monograph represents a summary of our work in the last two years in applying the method of simulated annealing to the solution of problems that arise in the physical design of VLSI circuits. Our study is experimental in nature, in that we are con­ cerned with issues such as solution representations, neighborhood structures, cost functions, approximation schemes, and so on, in order to obtain good design results in a reasonable amount of com­ putation time. We hope that our experiences with the techniques we employed, some of which indeed bear certain similarities for different problems, could be useful as hints and guides for other researchers in applying the method to the solution of other prob­ lems. Work reported in this monograph was partially supported by the National Science Foundation under grant MIP 87-03273, by the Semiconductor Research Corporation under contract 87-DP- 109, by a grant from the General Electric Company, and by a grant from the Sandia Laboratories.

This monograph represents a summary of our work in the last two years in applying the method of simulated annealing to the solution of problems that arise in the physical design of VLSI circuits. Our study is experimental in nature, in that we are con­ cerned with issues such as solution representations, neighborhood structures, cost functions, approximation schemes, and so on, in order to obtain good design results in a reasonable amount of com­ putation time. We hope that our experiences with the techniques we employed, some of which indeed bear certain similarities for different problems, could be useful as hints and guides for other researchers in applying the method to the solution of other prob­ lems. Work reported in this monograph was partially supported by the National Science Foundation under grant MIP 87-03273, by the Semiconductor Research Corporation under contract 87-DP- 109, by a grant from the General Electric Company, and by a grant from the Sandia Laboratories.

This volume contains the proceedings of the USA-Japan Joint Seminar on "Fracture Mechanics of Ductile and Tough Materials and Its Applications to Energy Related Structures". The seminar was supported jointly by the National Science Foundation of the United States and the Japan Society for the Promotion of Sciences. The seminar was held from November 12th to 16th, 1979, at Hayama, Japan, a picturesque resort town by the beach of Sagami Bay facing Mt. Fugi. The safety and integrity of the engineering structures for energy explora­ tion, energy production, and energy transportation are of utmost importance to our welfare. Both the United States and Japan are at the forefront of the re­ search on fracture mechanics and its applications to fracture prevention. Dur­ ing the past few years, major research efforts have been made in the areas of non-linear fracture mechanics and its applications to fracture initiation, slow crack growth, creep and fatigue. This joint seminar offered an unique opportunity for detailed exchange of information on current researches and fu­ ture efforts.

This volume contains the proceedings of the USA-Japan Joint Seminar on "Fracture Mechanics of Ductile and Tough Materials and Its Applications to Energy Related Structures". The seminar was supported jointly by the National Science Foundation of the United States and the Japan Society for the Promotion of Sciences. The seminar was held from November 12th to 16th, 1979, at Hayama, Japan, a picturesque resort town by the beach of Sagami Bay facing Mt. Fugi. The safety and integrity of the engineering structures for energy explora­ tion, energy production, and energy transportation are of utmost importance to our welfare. Both the United States and Japan are at the forefront of the re­ search on fracture mechanics and its applications to fracture prevention. Dur­ ing the past few years, major research efforts have been made in the areas of non-linear fracture mechanics and its applications to fracture initiation, slow crack growth, creep and fatigue. This joint seminar offered an unique opportunity for detailed exchange of information on current researches and fu­ ture efforts.