I. Rechenberg – författare

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3 produkter

1. 

   Defect Recognition and Image Processing in Semiconductors 1997

   Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997

   Av J. Doneker, I. Rechenberg

   Inbunden, 1998

   7579 kr

   Lägg i varukorg

   Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and …

2. 

   Defect Recognition and Image Processing in Semiconductors 1997

   Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997

   Av I. Rechenberg, J. Doneker

   E-bok, 2017

   5541 kr

   Lägg i varukorg

   Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and …

3. 

   Defect Recognition and Image Processing in Semiconductors 1997

   Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997

   Av I. Rechenberg, J. Doneker

   E-bok, 2017

   5421 kr

   Lägg i varukorg

   Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and …