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  1. III Stewart E. Rauch, Timothy D. Sullivan, Giuseppe La Rosa, Jordi Sune, Rolf-Peter Vollertsen, Ernest Y. Wu, Alvin W. Strong - Reliability Wearout Mechanisms in Advanced CMOS Technologies, E-bok. Tillgänglighet: Lägg i varukorg

    Reliability Wearout Mechanisms in Advanced CMOS Technologies

    Av III Stewart E. Rauch, Timothy D. Sullivan m. fl.

    E-bok, 2009

    2639 kr

    Lägg i varukorg

    This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or …