J. Laszlo – författare

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3 produkter

1. 

   Defect Complexes in Semiconductor Structures

   Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982

   Av J. Giber, F. Beleznay m. fl.

   Häftad, 1983

   1096 kr

   Lägg i varukorg

2. 

   Secondary Ion Mass Spectrometry SIMS III

   Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981

   Av H.W. Werner, M. Riedel m. fl.

   E-bok, 2012

   1427 kr

   Lägg i varukorg

   Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest …

3. 

   Secondary Ion Mass Spectrometry SIMS III

   Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981

   Av A. Benninghoven, J. Giber m. fl.

   Häftad, 2012

   1096 kr

   Lägg i varukorg

   Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest …