A. Benninghoven – författare

This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or­ ganizing committee under the auspices of the international organizing com­ mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap­ idly expanding activities in the SIMS field, informative papers were pre­ sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput­ tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica­ tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate­ rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.

The Second International Conference on Ion Formation from Organic Solids (IFOS II) was held at the University of MUnster, Federal Republic of Germa­ ny, from September 7 to 9, 1982. The subject of the conference was the rapid­ ly developing field of ion formation from ~nvolatile, thermally labile organ­ ic compounds. Rapid progress has been made in this field in the last few years, mainly because of the discovery of unexpected new ionization proces­ ses such as sputtering and laser-induced desorption. The aim of the conference was twofold: to acquire a basic understanding of these "soft" ionization processes on the one hand, and to examine their present and future analytical applications on the other. ~Je sought to bring. together scientists working in fundamental as well as applied research. The participants represented such widely varied fields as pure and applied phys­ ics and chemistry, biochemistry, nuclear and solid-state physics, medicine, and pharmacology. These proceedings contain all of the papers presented at the conference. Six review papers cover the fundamentals of different ionization processes. The authors of these reviews were asked to give up-to-date surveys in­ cluding characteristics of spectra, the influence of excitation parameters, tentative models for ion formation processes, and assessments of their ana­ lytical applications. These reviews are followed by 26 contributed papers dealing with more specialized aspects of the ionization processes and their analytical applications.