M. Amara – författare

This book explores the significance of sport in the understanding of past and current societal dynamics in the Arab world. It examines sport in relation to cultural, political and economic changes in the Arab World, including nation-state building, the formation of national identity and international relations in post-colonial context.

This book explores the significance of sport in the understanding of past and current societal dynamics in the Arab world. It examines sport in relation to cultural, political and economic changes in the Arab World, including nation-state building, the formation of national identity and international relations in post-colonial context.

In this book we will explore in more detail some aspects of the Arab-Jewish divide, which raise fundamental questions regarding the place of the Arabs and Arab language education in the Jewish State. More specifically, the aim of this book is to describe and analyze language education in the Arab society in Israel from the establishment of the state in 1948 until today. For this purpose, internal processes, which are embedded within the Arab population itself were examined, such as the socio-economic condition of the population, the diglossic situation in the Arabic language, and the wide use of Hebrew among Arabic speakers. Furthermore, the book also deals with external processes such as the policy of control and inspection of the Ministry of Education over the Arab education system in general and on language education in particular, the dominance of Hebrew, and the definition and perception of Israel as a Jewish State. The influence of both internal and external processes on language education and learning achievements will also be extensively discussed.

The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop­ ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.