Masashi Horiguchi – författare
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6 produkter
Ultra-Low Voltage Nano-Scale Memories
Av Kiyoo Itoh, Masashi Horiguchi m. fl.
Inbunden, 2007
1643 kr
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Ultra-Low Voltage Nano-Scale Memories provides an in-depth discussion of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically covered in terms of …
Ultra-Low Voltage Nano-Scale Memories
Av Hitoshi Tanaka, Masashi Horiguchi m. fl.
E-bok, 2007
1622 kr
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Ultra-Low Voltage Nano-Scale Memories provides an in-depth discussion of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically covered in terms of …
Ultra-Low Voltage Nano-Scale Memories
Av Kiyoo Itoh, Masashi Horiguchi m. fl.
Häftad, 2010
1207 kr
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Ultra-Low Voltage Nano-Scale Memories provides an in-depth discussion of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically covered in terms of …
Nanoscale Memory Repair
Av Masashi Horiguchi, Kiyoo Itoh
Inbunden, 2011
1643 kr
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Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as …
Nanoscale Memory Repair
Av Kiyoo Itoh, Masashi Horiguchi
E-bok, 2011
1570 kr
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Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as …
Nanoscale Memory Repair
Av Masashi Horiguchi, Kiyoo Itoh
Häftad, 2013
1207 kr
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Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as …
