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3 produkter

  1. Muthukumaran Malarvel, Soumya Ranjan Nayak, Surya Narayan Panda, Prasant Kumar Pattnaik, Nittaya Muangnak - Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications, Inbunden. Tillgänglighet: Lägg i varukorg

    Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

    Av Muthukumaran Malarvel, Soumya Ranjan Nayak m. fl.

    Inbunden, 2020

    2280 kr

    Lägg i varukorg

    This edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier …

  2. Nittaya Muangnak, Prasant Kumar Pattnaik, Surya Narayan Panda, Soumya Ranjan Nayak, Muthukumaran Malarvel - Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications, E-bok. Tillgänglighet: Lägg i varukorg

    Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

    Av Nittaya Muangnak, Prasant Kumar Pattnaik m. fl.

    E-bok, 2020

    2662 kr

    Lägg i varukorg

    This edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier …

  3. Nittaya Muangnak, Prasant Kumar Pattnaik, Surya Narayan Panda, Soumya Ranjan Nayak, Muthukumaran Malarvel - Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications, E-bok. Tillgänglighet: Lägg i varukorg

    Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

    Av Nittaya Muangnak, Prasant Kumar Pattnaik m. fl.

    E-bok, 2020

    2662 kr

    Lägg i varukorg

    This edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier …