Paweł Piotr Michałowski – författare
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3 produkter
Secondary Ion Mass Spectrometry
Fundamentals, Advancements and Applications
Inbunden, 2025
3985 kr
Lägg i varukorg
Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in …
Secondary Ion Mass Spectrometry
Fundamentals, Advancements and Applications
E-bok, 2025
3569 kr
Lägg i varukorg
Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in …
Secondary Ion Mass Spectrometry
Fundamentals, Advancements and Applications
E-bok, 2025
3569 kr
Lägg i varukorg
Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in …
