Pedro Pina – författare
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4 produkter
Pattern Recognition and Image Analysis
Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part 1
Av Jorge S. Marques, Nicolás Pérez de la Blanca m. fl.
Häftad, 2005
1129 kr
Lägg i varukorg
IbPRIA 2005 (Iberian Conference on Pattern Recognition and Image Analysis) was the second of a series of conferences jointly organized every two years by the Portuguese and Spanish Associations for Pattern Recognition (APRP, AERFAI), with the support of the International Association for Pattern …
Pattern Recognition and Image Analysis
Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceeding, Part II
Av Jorge S. Marques, Nicolás Pérez de la Blanca m. fl.
Häftad, 2005
1129 kr
Lägg i varukorg
IbPRIA 2005 (Iberian Conference on Pattern Recognition and Image Analysis) was the second of a series of conferences jointly organized every two years by the Portuguese and Spanish Associations for Pattern Recognition (APRP, AERFAI), with the support of the International Association for Pattern …
Pattern Recognition and Image Analysis
Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part 1
Av Pedro Pina, Nicolas Perez de la Blanca m. fl.
E-bok, 2005
1502 kr
Lägg i varukorg
IbPRIA 2005 (Iberian Conference on Pattern Recognition and Image Analysis) was the second of a series of conferences jointly organized every two years by the Portuguese and Spanish Associations for Pattern Recognition (APRP, AERFAI), with the support of the International Association for Pattern …
Pattern Recognition and Image Analysis
Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceeding, Part II
Av Pedro Pina, Nicolas Perez de la Blanca m. fl.
E-bok, 2005
1470 kr
Lägg i varukorg
IbPRIA 2005 (Iberian Conference on Pattern Recognition and Image Analysis) was the second of a series of conferences jointly organized every two years by the Portuguese and Spanish Associations for Pattern Recognition (APRP, AERFAI), with the support of the International Association for Pattern …
