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Ravi K. Gulati – författare

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3 produkter

  1. Ravi K. Gulati, Charles F. Hawkins - IDDQ Testing of VLSI Circuits, Inbunden. Tillgänglighet: Lägg i varukorg

    IDDQ Testing of VLSI Circuits

    Av Ravi K. Gulati, Charles F. Hawkins

    Inbunden, 1992

    1096 kr

    Lägg i varukorg

    Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply …

  2. Ravi K. Gulati, Charles F. Hawkins - IDDQ Testing of VLSI Circuits, Häftad. Tillgänglighet: Lägg i varukorg

    IDDQ Testing of VLSI Circuits

    Av Ravi K. Gulati, Charles F. Hawkins

    Häftad, 2012

    1096 kr

    Lägg i varukorg

    Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply …

  3. Charles F. Hawkins, Ravi K. Gulati - IDDQ Testing of VLSI Circuits, E-bok. Tillgänglighet: Lägg i varukorg

    IDDQ Testing of VLSI Circuits

    Av Charles F. Hawkins, Ravi K. Gulati

    E-bok, 2012

    1459 kr

    Lägg i varukorg

    Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply …