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Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a deformed crystal. It discusses the dynamical theory of diffraction of fast electrons, the treatment of absorption in the dynamical theory of electron diffraction, the use of electron microscopy to study planar interfaces, and analysis of weak-beam images. The book also covers the use of computed electron micrographs in defect identification, crystallographic analysis of dislocation loops containing shear components, and detection and identification of small coherent particles. In addition, the reader is introduced to interpretation of diffuse scattering and short-range order, along with the crystallography of martensitic transformations. The remaining chapters focus on the working principle of the transmission electron microscope, experimental structure imaging of crystals, and the study of diffuse scattering effects originating from substitutional disorder and displacement disorder. The information on diffraction and imaging techniques in material science contained in this book will be helpful to students, researchers, and scientists.

Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.

The Observation of Atomic Collisions in Crystalline Solids presents a critical account of the more important experiments which have provided the basis for a better understanding of atomic collision phenomena in crystalline solids. Collisions have been divided into two artificial regimes; primary collisions which deal with the interaction of the incident particles with the solid, and secondary collisions which deal with those events which occur as a result of lattice atoms recoiling from primary encounters. Although the book is intended principally for the experimentalist some simple theoretical models have been introduced. It is hoped that the book will provide a useful introduction to the subject of atomic collisions in solids for the post-graduate research student, as well as providing a collection of the most important experimental data for established scientists actively engaged in the field. It is also intended to provide a background for the technologist engaged in such fields as the ion implantation doping of semiconductors.

Defects in Solids, Volume 14: Thermodynamics of Point Defects and Their Relation with Bulk Properties focuses on the methodologies, approaches, and reactions involved in the study of point defects in solids. The book first offers information on thermodynamic functions and formation of vacancies. Topics include parameters from the comparison with isochoric perfect crystal; relation between isobaric and isochoric parameters; temperature dependence of thermodynamic functions of solids; and statistical approach to vacancy parameters. The text then ponders on the formation of other point defects, migration, and thermodynamics of specific heat. The publication explains the analysis of experiments yielding defect parameters, including X-ray parameters, analysis of specific heat measurements, and ionic conductivity and reorientation of dipoles. The text also takes a look at mixed alkali and silver halides, explanation of empirical laws, as well as explanation of the empirical laws connecting activation entropy and enthalpy to the activation volume and variation of the bulk modulus with composition. The selection is a dependable reference for scientists and geophysicists interested in the thermodynamics of point defects.

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.