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S. Morita – författare

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4 produkter

  1. S. Morita, T. Mizutani, Y. Matsumoto - Fete of Topology, E-bok. Tillgänglighet: Lägg i varukorg

    Fete of Topology

    Papers Dedicated to Itiro Tamura

    Av S. Morita, T. Mizutani m. fl.

    E-bok, 2014

    1023 kr

    Lägg i varukorg

    A Fête of Topology: Papers Dedicated to Itiro Tamura focuses on the progress in the processes, methodologies, and approaches involved in topology, including foliations, cohomology, and surface bundles. The publication first takes a look at leaf closures in Riemannian foliations and differentiable …

  2. Roland Wiesendanger, E. Meyer, S. Morita, Roland Wiesendanger, E. Meyer - Noncontact Atomic Force Microscopy, Inbunden. Tillgänglighet: Lägg i varukorg

    Noncontact Atomic Force Microscopy

    Av Roland Wiesendanger, E. Meyer m. fl.

    Inbunden, 2002

    2188 kr

    Lägg i varukorg

    Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic …

  3. E. Meyer, Roland Wiesendanger, S. Morita - Noncontact Atomic Force Microscopy, E-bok. Tillgänglighet: Lägg i varukorg

    Noncontact Atomic Force Microscopy

    Av E. Meyer, Roland Wiesendanger m. fl.

    E-bok, 2012

    2925 kr

    Lägg i varukorg

    Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic …

  4. S. Morita, Roland Wiesendanger, E. Meyer - Noncontact Atomic Force Microscopy, Häftad. Tillgänglighet: Lägg i varukorg

    Noncontact Atomic Force Microscopy

    Av S. Morita, Roland Wiesendanger m. fl.

    Häftad, 2012

    2188 kr

    Lägg i varukorg

    Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic …