Sheldon Tan – författare

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5 produkter

1. 

   Advanced Model Order Reduction Techniques in VLSI Design

   Av Sheldon Tan, Lei He

   Inbunden, 2007

   2149 kr

   Lägg i varukorg

   Model order reduction (MOR) techniques reduce the complexity of VLSI designs, paving the way to higher operating speeds and smaller feature sizes. This book presents a systematic introduction to, and treatment of, the key MOR methods employed in general linear circuits, using real-world examples to …

2. 

   Advanced Model Order Reduction Techniques in VLSI Design

   Av Sheldon Tan, Lei He

   Häftad, 2012

   748 kr

   Lägg i varukorg

   Model order reduction (MOR) techniques reduce the complexity of VLSI designs, paving the way to higher operating speeds and smaller feature sizes. This book presents a systematic introduction to, and treatment of, the key MOR methods employed in general linear circuits, using real-world examples to …

3. 

   Long-Term Reliability of Nanometer VLSI Systems

   Modeling, Analysis and Optimization

   Av Sheldon Tan, Mehdi Tahoori m. fl.

   Inbunden, 2019

   1643 kr

   Lägg i varukorg

   This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent …

4. 

   Long-Term Reliability of Nanometer VLSI Systems

   Modeling, Analysis and Optimization

   Av Saman Kiamehr, Zeyu Sun m. fl.

   E-bok, 2019

   2111 kr

   Lägg i varukorg

   This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent …

5. 

   Long-Term Reliability of Nanometer VLSI Systems

   Modeling, Analysis and Optimization

   Av Sheldon Tan, Mehdi Tahoori m. fl.

   Häftad, 2020

   1643 kr

   Lägg i varukorg

   This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent …