Shengcheng Wang – författare
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3 produkter
Long-Term Reliability of Nanometer VLSI Systems
Modeling, Analysis and Optimization
Av Sheldon Tan, Mehdi Tahoori m. fl.
Inbunden, 2019
1643 kr
Lägg i varukorg
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent …
Long-Term Reliability of Nanometer VLSI Systems
Modeling, Analysis and Optimization
Av Saman Kiamehr, Zeyu Sun m. fl.
E-bok, 2019
2111 kr
Lägg i varukorg
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent …
Long-Term Reliability of Nanometer VLSI Systems
Modeling, Analysis and Optimization
Av Sheldon Tan, Mehdi Tahoori m. fl.
Häftad, 2020
1643 kr
Lägg i varukorg
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent …
