Shih-Lin In-Hang – författare

The consecutive-k system was first studied around 1980, and it soon became a very popular subject. The reasons were many-folded, includ­ ing: 1. The system is simple and natural. So most people can understand it and many can do some analysis. Yet it can grow in many directions and there is no lack of new topics. 2. The system is simple enough to become a prototype for demonstrat­ ing various ideas related to reliability. For example, the interesting concept of component importance works best with the consecutive-k system. 3. The system is supported by many applications. Twenty years have gone and hundreds of papers have been published on the subject. This seems to be a good time for retrospect and to sort the scattered material into a book. Besides providing our own per­ spective, the book will also serve as an easy reference to the numerous ramifications of the subject. It is hoped that a summary of work in the current period will become the seed of future break-through.

The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg''s law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin­ ciple, reflect three-dimensional information about the structure of the dif­ fracting material. Recent progress in understanding this diffraction phenome­ non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys­ tematic review of this type of diffraction, encompasses its diverse applica­ tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.