Each year synchrotron facilities, both in the United States and in other countries, are utilized for more applications of synchrotron radiation as they pertain to materials science. Both basic and applied research possibilities are manyfold, including studies of materials mentioned below and those that are yet to be discovered. The combination of synchrotron-based spectroscopic techniques with ever-increasing high-resolution microscopy allows researchers to study very small domains of materials in an attempt to understand their chemical and electronic properties. This is especially important for composites and related materials involving material bonding interfaces. This book brings together the materials science community and the characterization techniques that use synchrotron radiation. Topics include surfaces, interfaces, electronic materials, metal oxides, metal sulfides, radiation detector materials, thin films, carbides, polymers, alloys, nanoparticles, and metal composites. Results reported in the volume address recent advances in X-ray absorption and scattering, imaging, tomography, microscopy, and diffraction methods.

Each year synchrotron facilities, both in the United States and in other countries, are utilized for more applications of synchrotron radiation as they pertain to materials science. Both basic and applied research possibilities are manyfold, including studies of materials mentioned below and those that are yet to be discovered. The combination of synchrotron-based spectroscopic techniques with ever-increasing high-resolution microscopy allows researchers to study very small domains of materials in an attempt to understand their chemical and electronic properties. This is especially important for composites and related materials involving material bonding interfaces. This book brings together the materials science community and the characterization techniques that use synchrotron radiation. Topics include surfaces, interfaces, electronic materials, metal oxides, metal sulfides, radiation detector materials, thin films, carbides, polymers, alloys, nanoparticles, and metal composites. Results reported in the volume address recent advances in X-ray absorption and scattering, imaging, tomography, microscopy, and diffraction methods.