Umberto Celano – författare
Visar alla böcker från författaren Umberto Celano. Handla med fri frakt och snabb leverans.
6 produkter
Electrical Atomic Force Microscopy for Nanoelectronics
Inbunden, 2019
1970 kr
Lägg i varukorg
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their …
Electrical Atomic Force Microscopy for Nanoelectronics
E-bok, 2019
2599 kr
Lägg i varukorg
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their …
Electrical Atomic Force Microscopy for Nanoelectronics
Häftad, 2020
1970 kr
Lägg i varukorg
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their …
Metrology and Physical Mechanisms in New Generation Ionic Devices
Inbunden, 2016
1098 kr
Lägg i varukorg
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author …
Metrology and Physical Mechanisms in New Generation Ionic Devices
E-bok, 2016
1459 kr
Lägg i varukorg
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author …
Metrology and Physical Mechanisms in New Generation Ionic Devices
Häftad, 2018
1481 kr
Tillfälligt slut
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM.
