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DIAGNOSTIC MEASUREMENTS IN LSI/VLSI INTEGRATED CIRCUITS PRODUCTION
Av A Jakubowski, W Marciniak m. fl.
Inbunden, 1991
1823 kr
Tillfälligt slut
This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic …