William M. Mueller – författare

It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com­ munity, a versatility limited only by the imagination and inge­ nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt­ edly be influenced by today's extremely low- and very high-tem­ perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame­ nable to pathological and physiological diagnosis. The experi­ mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac­ complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re­ searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.

The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con­ ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re­ search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.

The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com­ bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor­ escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica­ tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com­ bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor­ escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica­ tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur­ red of representatives from industrial laboratories, universities, and manu­ facturers of x-ray equipment. Papers which deal with the fundamental as­ pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.

The Ninth Annual Conference on Applications of X-Ray Anal­ ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado. Forty­ one papers on new developments in X-ray analytical techniques and instrumentation were presented. This volume contains thirty­ eight of those papers. Research in X-ray analytical methods is a dynamic and expanding area of scientific investigation. Each year exciting and stimulating progress is reported in the various regions of this field. Suitable documentation of the results is the purpose of the series "Advances in X-Ray Analysis. " Participation in the Conference by two distinguished European scientists, Dr. Raymond Castaing of the University of Paris, France, and Dr. Arnold Hargreaves of the Manchester College of Science and Technology, England, was made possible through financial aid provided by the United States Office of Naval Re­ search. This assistance is greatly appreciated. Major contributions to the conference were made by the following individuals who chaired the technical sessions: Dr. William D. Forgeng, Electro Metallurgical Company, Niagara Falls, New York Dr. Kurt F. J. Heinrich, E. I. du Pont de Nemours and Company, Wilmington, Delaware Mr. Robert A. McCune, University of Denver, Denver, Colorado Dr. Dan McLachlan, Jr. , Stanford Research Institute, Menlo Park, California Dr. William H. Robinson, Carnegie Institute of Technology, Pittsburgh, Pennsylvania Dr.

Consider for a few moments the staggering magnitude of technological advance which has occurred since the birth four centuries ago of that early progenitor of the scientific method, Galileo. Think also about the extent of scientific knowledge avail­ able during the lifetime of Galileo and his associates; knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat­ ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world's scientific knowledge. New developments - expanded technological concepts - occur with dazzling rapidity, often faster than they can be assimilated. At the same time there are practical limitations to the extent of formal education. Continuing education, upgrading of scientific know-how, retraining to assure full utilization of existing knowledge - these are urgent problems which today confront the nation's scientific community. And there is never enough time. The problem is compounded by the increasing burden of information retrieval.

A real need exists for ways to bridge the gap between basic research and prac­ tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish­ ments to the civilian economy. The problem is compounded by the torrential flow of technical information. Thirty million books are available on technical subjects, the total increasing at the rate of six hundred every day. There are one hundred thousand technical journals. More scientific work has been published in the past ten years than in all preceding recorded history. Scientists and engineers only a few years beyond academic pursuits are already encountering a continuing need for retraining and expansion of their own knowledge. At the same time, the re­ searchers - scientists, engineers, students - must exhibit bold creative thinking to evolve new technology, to better understand nature's secrets, to conceive new theories, and to reduce old theories to practical utilization. Research in the physical sciences and the engineering sciences provides the ever-flowing spring of knowledge for the investigation of new ideas. Such research is sometimes hindered by classification as "basic" or "applied. " There are many times when a research program has no immediate or ultimate objective and is truly contributing to our reservoir of knowledge - a reservoir which will certainly be tapped in the future.

The torrential flow of technical information appearing in the world sources of literature is creating concern and apprehension among scientific people at all levels. It is extremely difficult to keep abreast of information flowing into a specific field. It is nearly impossible to transcend traditional confines of individual disciplines and put to effective use all pertinent information which stems from continuously increased trans­ disciplinary research. At the same time the researcher is faced with problems of in­ creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest. This is readily observed with X-ray analysis, where the chemist, physicist, metallurgist, and engineer are each faced with the solution of problems peculiar to specific disciplines but where solutions frequently correlate with the particular needs of the others. The Annual Conference on Applications of X-Ray Analysis and the subsequent Advances in X-Ray Analysis contribute to better understanding of multidisciplinary accomplishments; they are a ready source of information for the researcher who must undertake an abrupt change in emphasis for new objectives. The scope of this conference is broad--concerning itself, as it does, with latest developments in high-temperature and cryogenic techniques, phase equilibria, crystal structures, polymers, microprobes, and new developments in instrumentation.