Willy Rachmady – författare

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2 produkter

1. 

   CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

   Av Alexander A. Demkov, Bill Taylor m. fl.

   Häftad, 2014

   455 kr

   Lägg i varukorg

   To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at …

2. 

   CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

   Av Alexander A. Demkov, Bill Taylor m. fl.

   Inbunden, 2009

   1628 kr

   Lägg i varukorg

   To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at …