Xiaowei Li – författare & böcker

Research on the Development and Education of 0-3-Year-Old Children in China

Inbunden, Engelska, 2019

1 271 kr

Skickas inom 10-15 vardagar

This book reports on the findings of a series of studies on the development of zero-to-three-year-old Chinese children supported by the Fundamental Research Funds for the Central Universities. The studies were conducted by a research group at the Institute of Early Childhood Education, Beijing Normal University. In the first part of the book, findings concerning the developmental trajectory are presented, including physical and motor development, cognitive development, language development, social and emotional development. The focus of the second part is on the effect of family environment and practices. Specifically, the authors provide empirical evidence allowing readers to better understand how the home environment and educational practice in the family impact the psychological development of children in their early years. In the last part, culture-specific issues like the new universal two-child policy in China are discussed. Most of the parts are based on large-scale investigations and analysis of the status quo, complemented by small-sample studies and case studies. The findings presented here will promote theory building and public understanding of early care and education in China. Moreover, the behavior observation scales and assessment tools developed by the research group are cultural appropriate and may serve as a foundation for further studies on early care and education in the Chinese cultural context.

Research on the Development and Education of 0-3-Year-Old Children in China

AvYuejuan Pan,Xinghua Wangm. fl.

E-bok

Engelska, 2019

1 639 kr

Läs direkt efter köp

This book reports on the findings of a series of studies on the development of zero-to-three-year-old Chinese children supported by the Fundamental Research Funds for the Central Universities. The studies were conducted by a research group at the Institute of Early Childhood Education, Beijing Normal University. In the first part of the book, findings concerning the developmental trajectory are presented, including physical and motor development, cognitive development, language development, social and emotional development. The focus of the second part is on the effect of family environment and practices. Specifically, the authors provide empirical evidence allowing readers to better understand how the home environment and educational practice in the family impact the psychological development of children in their early years. In the last part, culture-specific issues like the new universal two-child policy in China are discussed. Most of the parts are based on large-scale investigations and analysis of the status quo, complemented by small-sample studies and case studies. The findings presented here will promote theory building and public understanding of early care and education in China. Moreover, the behavior observation scales and assessment tools developed by the research group are cultural appropriate and may serve as a foundation for further studies on early care and education in the Chinese cultural context.

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

AvXiaowei Li,Guihai Yanm. fl.

Inbunden, Engelska, 2023

2 239 kr

Skickas inom 10-15 vardagar

With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not onlyoffers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

AvCheng Liu,Guihai Yanm. fl.

E-bok

Engelska, 2023

2 933 kr

Läs direkt efter köp

With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not onlyoffers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield.

This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.

Xiaowei Li, Guihai Yan - Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach, Övrigt

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

AvXiaowei Li,Guihai Yan

Engelska, 2023

644 kr

Skickas inom 5-8 vardagar

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

AvXiaowei Li,Guihai Yanm. fl.

Häftad, Engelska, 2024

2 239 kr

Skickas inom 10-15 vardagar

With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not onlyoffers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.

Xiaowei Li – författare

Research on the Development and Education of 0-3-Year-Old Children in China

Research on the Development and Education of 0-3-Year-Old Children in China

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Chinese Pinyin for Beginners (Volume 1)- HSK All-Level Test Series, Rapid Mastery of Chinese Characters with Pinyin, English Meaning, Beginner Vocabulary, and Multiple-Choice Questions

Chinese Pinyin for Beginners (Volume 2)- HSK Test Prep Simplified, Learn Chinese Characters Fast with Pinyin, English Translations, and Easy Multiple-Choice Exercises

Chinese Pinyin for Beginners (Volume 3)- Fast-Track HSK Success, Reading Chinese Characters Made Easy with Pinyin, English Meanings, and Beginner Multiple-Choice Practice

Chinese Pinyin for Beginners (Volume 4)- HSK All-Level Character Boost, Accelerated Learning with Pinyin, English, and Simple Multiple-Choice Questions for Beginners

Chinese Pinyin for Beginners (Volume 5)- Chinese Character Crash Course for HSK

Chinese Pinyin for Beginners (Volume 6)- HSK All-Levels Character Blitz, Fast-Track Reading with Pinyin, English, and Beginner-Friendly Multiple-Choice Questions

Chinese Pinyin for Beginners (Volume 7)- Master HSK Characters Quickly, Pinyin, English Meanings, and Easy Multiple-Choice Practice for All Levels

Chinese Pinyin for Beginners (Volume 8)- HSK Character Speed Learning, Read Chinese Fast with Pinyin, English Translations, and Beginner Multiple-Choice Exercises

Chinese Pinyin for Beginners (Volume 9)- Chinese Character Crash Course for HSK, Pinyin, English, and Simple Multiple-Choice Questions to Boost Beginners

Chinese Pinyin for Beginners (Volume 10)- Chinese Character Masterclass for HSK, Pinyin, English Translations, and Fun Multiple-Choice Practice to Accelerate Beginner Learning

Chinese Pinyin for Beginners (Volume 11)- Chinese Character Blitz for HSK Success, Pinyin, English, and Interactive Quizzes to Supercharge Your Beginner Skills

Chinese Pinyin for Beginners (Volume 12)- Essential Chinese Character Guide for HSK Prep, Pinyin, English Meanings, and Practice Questions for Beginners

Chinese Pinyin for Beginners (Volume 13)- HSK All-Level Test Series, Rapid Mastery of Chinese Character Reading with Pinyin & English Translations, Beginner-Friendly Vocabulary, Multiple-Choice Questions

Chinese Pinyin for Beginners (Volume 14)- Comprehensive HSK Test Prep, Accelerated Learning of Chinese Characters with Pinyin and English Meanings, Simple Vocabulary, Multiple-Choice Exercises for Beginners

Chinese Pinyin for Beginners (Volume 15)- HSK All-Level Reading Test Series, Quick Guide to Chinese Characters with Pinyin & English Explanations, Easy Vocabulary, Multiple-Choice Questions for Novices