Yuhong Bai – författare
Visar alla böcker från författaren Yuhong Bai. Handla med fri frakt och snabb leverans.
2 produkter
2 produkter
Inbunden, Engelska, 2023
2 152 kr
Skickas inom 10-15 vardagar
This book is a collection of articles written by the world's leading scientists in the fields of holography, speckle, optical metrology, non-destructive testing, interferometry, shape measurement, and diffractive optics, to celebrate the 60th anniversary of holography in 2021 and its remarkable impact on numerous areas of science and engineering to the present day. Sixty years after the publication of the seminal article by Leith and Upatnieks, 55 years after the discovery of holographic interferometry by Stetson and Powel, 50 years after the invention of speckle metrology and Gabor's remarkable Nobel lecture in 1971, this unique collection provides a complete overview of this exciting field.More than 40 peer-reviewed papers offer a wealth of information on the history, 3D displays, modern microscopy, metrology, deep learning, and tools for virtual reality.Partly previously published open access in the journal “Light – Advanced Manufacturing”, Special Edition 2021 and 2022.
Häftad, Engelska, 2024
2 152 kr
Skickas inom 10-15 vardagar
This book is a collection of articles written by the world's leading scientists in the fields of holography, speckle, optical metrology, non-destructive testing, interferometry, shape measurement, and diffractive optics, to celebrate the 60th anniversary of holography in 2021 and its remarkable impact on numerous areas of science and engineering to the present day. Sixty years after the publication of the seminal article by Leith and Upatnieks, 55 years after the discovery of holographic interferometry by Stetson and Powel, 50 years after the invention of speckle metrology and Gabor's remarkable Nobel lecture in 1971, this unique collection provides a complete overview of this exciting field.More than 40 peer-reviewed papers offer a wealth of information on the history, 3D displays, modern microscopy, metrology, deep learning, and tools for virtual reality.Partly previously published open access in the journal “Light – Advanced Manufacturing”, Special Edition 2021 and 2022.