Zeev Zalevsky – författare

Nanophotonics is a newly developing and exciting field, with two main areas of interest: imaging/computer vision and data transport. The technologies developed in the field of nanophotonics have far reaching implications with a wide range of potential applications from faster computing power to medical applications, and "smart" eyeglasses to national security.

Integrated Nanophotonic Devices explores one of the key technologies emerging within nanophotonics: that of nano-integrated photonic modulation devices and sensors. The authors introduce the scientific principles of these devices and provide a practical, applications-based approach to recent developments in the design, fabrication and experimentation of integrated photonic modulation circuits.

For this second edition, all chapters have been expanded and updated to reflect this rapidly advancing field, and an entirely new chapter has been added to cover liquid crystals integrated with nanostructures.

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures.

Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.

This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips.

The authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips.

In this brief we review several approaches that provide super resolved imaging, overcoming the geometrical limitation of the detector as well as the diffraction effects set by the F number of the imaging lens. In order to obtain the super resolved enhancement, we use spatially non-uniform and/or random transmission structures to encode the image or the aperture planes. The desired resolution enhanced images are obtained by post-processing decoding of the captured data.

This book constitutes the refereed proceedings of the First International Conference on Artificial Intelligence and its Application, ICAIA 2023, held in Pune, India, during December 18–19, 2023.

The 37 full papers and 3 short papers presented in these two volumes were carefully reviewed and selected from 217 submissions. The conference focused on three primary domains: Use of AI in Health Care; Machine Vision and Image Processing; Automated and Digital Manufacturing Systems.

This book constitutes the refereed proceedings of the First International Conference on Artificial Intelligence and its Applications, ICAIA 2023, held in Pune, India, during December 18–19, 2023.

The 37 full papers and 3 short papers presented in these two volumes were carefully reviewed and selected from 217 submissions. The conference focused on three primary domains: Use of AI in Health Care; Machine Vision and Image Processing; Automated and Digital Manufacturing Systems.