Achieving Product Reliability
Necip Doganaksoy, William Q. Meeker, Gerald J. Hahn
Inbunden, 2021
1 281 kr
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AvWilliam Q. Meeker,Gerald J. Hahn
Del 541 i serien Wiley Series in Probability and Statistics
1 214 kr
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William Q. Meeker is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is the co-author of Statistical Methods for Reliability Data, 2nd Edition (Wiley, 2021) and of numerous publications in the engineering and statistical literature and has won many awards for his research.Gerald J. Hahn served for 46 years as applied statistician and manager of an 18-person statistics group supporting General Electric and has co-authored four books. His accomplishments have been recognized by GE's prestigious Coolidge Fellowship and 19 professional society awards.Luis A. Escobar is Professor of Statistics at Louisiana State University. He is the co-author of Statistical Methods for Reliability Data, 2nd Edition (Wiley, 2021) and several book chapters. His publications have appeared in the engineering and statistical literature and he has won several research and teaching awards.
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