Eugene R. Hnatek is Senior Director of Quality, Qualcomm Incorporated, San Diego, California. The author of 12 books, including Integrated Circuit Quality and Reliability, Second Edition, Revised and Expanded (Marcel Dekker, Inc.), and the author or coauthor of more than 250 professional publications, Mr. Hnatek is a member of the Institute of Environmental Sciences and Technology, the Electrostatic Discharge Association and the American Society for Quality. He received the B.S.E.E. and M.S.E.E. degrees from Bradley University, Peoria, Illinois.

• Preface, 1. Introduction to Reliability, 2. Basic Reliability Mathematics, 3. Robust Design Practices, 4. Component and Supplier Selection, Qualification, Testing and Management, 5. Thermal Management, 6. Electrostatic Discharge and Electromagnetic Compatibility, 7. Manufacturing/Production Practices, 8. Software, Appendix A: An Example of Part Derating Guidelines, Appendix B: FMEA Example for a Memory Module, Epilogue, Index

Eugene R. Hnatek is Senior Director of Quality, Qualcomm Incorporated, San Diego, California. The author of 12 books, including Integrated Circuit Quality and Reliability, Second Edition, Revised and Expanded (Marcel Dekker, Inc.), and the author or coauthor of more than 250 professional publications, Mr. Hnatek is a member of the Institute of Environmental Sciences and Technology, the Electrostatic Discharge Association and the American Society for Quality. He received the B.S.E.E. and M.S.E.E. degrees from Bradley University, Peoria, Illinois.

• Preface, 1. Introduction to Reliability, 2. Basic Reliability Mathematics, 3. Robust Design Practices, 4. Component and Supplier Selection, Qualification, Testing and Management, 5. Thermal Management, 6. Electrostatic Discharge and Electromagnetic Compatibility, 7. Manufacturing/Production Practices, 8. Software, Appendix A: An Example of Part Derating Guidelines, Appendix B: FMEA Example for a Memory Module, Epilogue, Index

Eugene R. Hnatek is Senior Director of Quality, Qualcomm Incorporated, San Diego, California. The author of 12 books, including Integrated Circuit Quality and Reliability, Second Edition, Revised and Expanded (Marcel Dekker, Inc.), and the author or coauthor of more than 250 professional publications, Mr. Hnatek is a member of the Institute of Environmental Sciences and Technology, the Electrostatic Discharge Association and the American Society for Quality. He received the B.S.E.E. and M.S.E.E. degrees from Bradley University, Peoria, Illinois.

• Preface, 1. Introduction to Reliability, 2. Basic Reliability Mathematics, 3. Robust Design Practices, 4. Component and Supplier Selection, Qualification, Testing and Management, 5. Thermal Management, 6. Electrostatic Discharge and Electromagnetic Compatibility, 7. Manufacturing/Production Practices, 8. Software, Appendix A: An Example of Part Derating Guidelines, Appendix B: FMEA Example for a Memory Module, Epilogue, Index