Yichuang Sun received his Ph.D. from the University of York and is currently Professor at the University of Hertfordshire. His research interests are in analogue and mixed-signal, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, and wireless and mobile networks. He has published three books and over 180 papers. Professor Sun has been a book series editor for the IET, guest editor of four special issues for IET journals, and Track Chair and committee member for many international conferences. He is editor of ETRI Journal of South Korea and serves on several IEEE committees.

• Chapter 1: Fault diagnosis of linear and non-linear analogue circuitsChapter 2: Symbolic function approaches for analogue fault diagnosisChapter 3: Neural-network-based approaches for analogue circuit fault diagnosisChapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosisChapter 5: DFT and BIST techniques for analogue and mixed-signal testChapter 6: Design-for-testability of analogue filtersChapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposalsChapter 8: Test of Sigma Delta convertersChapter 9: Phase-locked loop test methodologies: Current characterization and production test practicesChapter 10: On-chip testing techniques for RF wireless transceiver systems and componentsChapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits

Yichuang Sun received his Ph.D. from the University of York and is currently Professor at the University of Hertfordshire. His research interests are in analogue and mixed-signal, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, and wireless and mobile networks. He has published three books and over 180 papers. Professor Sun has been a book series editor for the IET, guest editor of four special issues for IET journals, and Track Chair and committee member for many international conferences. He is editor of ETRI Journal of South Korea and serves on several IEEE committees.

• Chapter 1: Fault diagnosis of linear and non-linear analogue circuitsChapter 2: Symbolic function approaches for analogue fault diagnosisChapter 3: Neural-network-based approaches for analogue circuit fault diagnosisChapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosisChapter 5: DFT and BIST techniques for analogue and mixed-signal testChapter 6: Design-for-testability of analogue filtersChapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposalsChapter 8: Test of Sigma Delta convertersChapter 9: Phase-locked loop test methodologies: Current characterization and production test practicesChapter 10: On-chip testing techniques for RF wireless transceiver systems and componentsChapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits

Yichuang Sun received his Ph.D. from the University of York and is currently Professor at the University of Hertfordshire. His research interests are in analogue and mixed-signal, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, and wireless and mobile networks. He has published three books and over 180 papers. Professor Sun has been a book series editor for the IET, guest editor of four special issues for IET journals, and Track Chair and committee member for many international conferences. He is editor of ETRI Journal of South Korea and serves on several IEEE committees.

• Chapter 1: Fault diagnosis of linear and non-linear analogue circuitsChapter 2: Symbolic function approaches for analogue fault diagnosisChapter 3: Neural-network-based approaches for analogue circuit fault diagnosisChapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosisChapter 5: DFT and BIST techniques for analogue and mixed-signal testChapter 6: Design-for-testability of analogue filtersChapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposalsChapter 8: Test of Sigma Delta convertersChapter 9: Phase-locked loop test methodologies: Current characterization and production test practicesChapter 10: On-chip testing techniques for RF wireless transceiver systems and componentsChapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits