VLSI Testing

Digital and mixed analogue/digital techniques

AvStanley L. Hurst

Inbunden, Engelska, 1997

Del i serien Materials, Circuits and Devices

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Beskrivning

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.

Produktinformation

Utgivningsdatum:1997-10-15
Mått:156 x 234 x 34 mm
Vikt:994 g
Format:Inbunden
Språk:Engelska
Serie:Materials, Circuits and Devices
Antal sidor:552
Förlag:Institution of Engineering and Technology
ISBN:9780852969014

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Mer om författaren

Stanley L. Hurst began his industrial career with Westinghouse Brake and Signal Company before leaving for academia in the 1960s. Initially with the Bristol College of Science and Technology and subsequently with the University of Bath, he specialised in digital electronic teaching and research, particularly in custom microelectronics and testing. In 1985 he was recruited by the Open University to produce educational material on these subjects for industry and continuing education courses. He is currently Academic Editor, Circuits and Systems, of the Microelectronics Journal. He holds the MSc(Eng) and PhD from the University of London, the DSc from the University of Bath, and is the author of some 50 papers and eight books in his subject area.

Recensioner i media

'The book covers the important aspects of VLSI testing, introduces a significant number of testing methods and strategies and is a valuable book on VLSI testing.'

Innehållsförteckning

Chapter 1: IntroductionChapter 2: Faults in digital circuitsChapter 3: Digital test pattern generationChapter 4: Signatures and self testChapter 5: Structured design for testability (DFT) techniquesChapter 6: Testing of structured digital circuits and microprocessorsChapter 7: Analogue testingChapter 8: Mixed analogue/digital system testChapter 9: The economics of test and final overall summaryAppendices