Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques

Robert (Rob) Thomas is the Principal Scientist at Scientific Solutions, a consulting company that serves the educational needs of the trace element analysis user community. He has worked in the field of atomic and mass spectroscopy for almost 50 years, including 24 years for a manufacturer of atomic spectroscopic instrumentation. He has served on the American Chemical Society (ACS) Committee on Analytical Reagents (CAR) for the past 20 years as leader of the plasma spectrochemistry, heavy metals task force, where he has worked very closely with the United States Pharmacopeia (USP) to align ACS heavy metal testing procedures with pharmaceutical guidelines. Rob has written over 100 technical publications, including a 15-part tutorial series on ICP-MS. He is also the editor of and frequent contributor to the Atomic Perspectives column in Spectroscopy magazine, as well as serving on the editorial advisory board of Analytical Cannabis. In addition, Rob has authored five textbooks on the fundamental principles and applications of ICP-MS. Prior to this new edition of Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques, his most recent book was a paperback version of Measuring Heavy Metal Contaminants in Cannabis and Hemp, published in December 2021. Rob has an advanced degree in analytical chemistry from the University of Wales, UK, and is also a fellow of the Royal Society of Chemistry (FRSC) and a Chartered Chemist (CChem).

• ContentsForewordPrefaceAcknowledgementsAuthor BioChapter 1: An Overview of ICP Mass SpectrometryChapter 2: Principles of Ion FormationChapter 3: Sample Introduction Chapter 4: Plasma SourceChapter 5: Interface RegionChapter 6: Ion Focusing SystemChapter 7: Mass Analyzers: Quadrupole TechnologyChapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology Chapter 9: Mass Analyzers: Time-Of-Flight TechnologyChapter 10: Mass Analyzers: Collision/Reaction Cell and Interface TechnologyChapter 11: Ion Detection Chapter 12: Peak Measurement ProtocolChapter 13: Methods of Quantitation Chapter 14: Review of InterferencesChapter 15: Routine Maintenance Chapter 16: Sampling and Sample Preparation Procedures Chapter 17: Reducing Errors from ContaminationChapter 18: Alternative Sampling AccessoriesChapter 19: Trace Element Speciation TechniquesChapter 20: The ICP-MS Application Landscape Chapter 21: Fundamental Principles and Applications of Atomic Absorption/FluorescenceChapter 22: Fundamental Principles and Applications of ICP Optical Emission SpectrometryChapter 23: Fundamental Principles of Applications of Other Atomic Spectroscopic Techniques X Ray Analytical Techniques (XRF/XRD) Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES) Laser Induced Breakdown Spectrometry (LIBS) Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry (LALI-TOF-MS)Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy TechniquesChapter 25: Cost of Analysis of AS TechniquesChapter 26: How to Select an ICP-MS: Some Important Analytical Considerations Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)Chapter 28: Useful Contact Information